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eMemory Announces the First Verified NeoFuse OTP IP in 16nm FinFET Plus Process

瀏覽次數:1124

HSINCHU, Taiwan – eMemory announces its new technology breakthrough–the availability of its One-Time Programmable (OTP) NeoFuse technology in 16nm FinFET Plus process, as well as the development and verification of high-capacity (256k bit) and low-voltage (<0.8V) silicon IPs. It is the world’s first OTP technology verified in 16nm FinFET Plus process

eMemory’s NeoFuse technology features “Short Time One-Pulse” data programming, unlike conventional anti-fuse OTP technologies require multiple-pulses programming that disturbs the accuracy of programmed data and requires longer programming and verification time, therefore result in higher coding cost and reliability issues.

eMemory’s 16nm NeoFuse IP works at single ultra-low voltage. Operating at ultra-low voltage enables the handshaking of signals before system is activated, which enhances data protection and security for mobile payment and IoT-related applications. NeoFuse IP is able to run on a single low voltage instead of dual voltages, thereby significantly alleviates design complexity of customer’s SoC products.

eMemory has completed high-capacity and low-voltage NeoFuse OTP IP verification in 16nm FinFET Plus process. It will be officially unveiled at the TSMC 2015 Open Innovation Platform (OIP) Ecosystem Forum in Santa Clara, California, on September 17, 2015.

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電池供電的感測器、智慧家居與可攜式裝置,經常花大量時間等待事件。延長續航的關鍵,是讓CPU只在需要時工作,並把監測、取樣…