A powerful pattern cyclizer technology enables on-the-fly pattern creation for single site, or up to four independent multi-sites, with high-voltage channels and open drain pins for simultaneous device test. This saves the engineer valuable time during design validation and production test.

"We are the first to deliver high-speed, flexible digital pattern generation with synchronized multi-site stimulus/response capability in the PXIe form factor," said Keysight's Mario Narduzzi, marketing manager, Software and Modular Solutions Division.

"This is part of our continued effort to speed up validation and production test throughput for test engineers."

Features:

－ Emulation of serial and parallel digital device interfaces

－ Precise vector time with a powerful combination of waveform tables and up to 250 ns stimulus/response delay compensation with 25 ps programming resolution

－ Industry-leading 1 ns-per-bit edge placement resolution giving engineers the ability to validate device design with greater accuracy

－ Digital instrument control and pattern generation/editing, enabled through a soft front panel

－ Full-featured drivers and IEEE-1450 STIL programming standard or Open XML (Excel)

－ Test development software that speeds waveform pattern creation

－ Import of patterns created by automated test applications