Circuit designers employ power devices in a wide range of products, therefore requiring an accurate, thorough understanding of their performance over a wide range of conditions. However, power device data sheets typically show behavior across only a limited range of operating conditions, and obtaining key datasheet parameters is not a straightforward process. By providing an automated, easy-to-use way to extract power device parameters, Agilent's B1506A Power Device Analyzer for Circuit Design is well equipped to overcome these challenges.

The B1506A measures and evaluates all kinds of parameters, including IV parameters (e.g., breakdown voltage and on-resistance); three terminal capacitances (Ciss, Coss, and Crss) with high-voltage bias; gate charge; switching time; and power losses. It also provides a fully automated measurement of temperature dependency for all parameters, from -50 °C to +250 °C, and seamlessly integrates with Thermal Plate or Thermostream from inTest Corp.

An intuitive GUI makes it easy for even a novice user to extract critical device parameters across a wide range of current, voltage and temperature conditions. Such capabilities make the B1506A ideal for helping designers select the right power devices for their power electronic circuits, and for power electronics manufacturers conducting incoming device inspection and failure analysis.

"While the power devices used in power electronics circuits are key to meeting industry requirements for low power loss and high switching frequency, until now no suitable solution has existed for evaluating all of the characteristics of those devices," said Masaki Yamamoto, general manager of Agilent's Hachioji Semiconductor Test Division.

"The B1506A promises to fill this gap by providing complete characterization for those key power devices in an automated fashion."

Features:

－ Measures all IV parameters (Ron, BV, Leakage, Vth, Vsat, etc.)

－ Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss, Cies, Coes, Cres, Rg) at high bias voltages

－ Qg curve measurement

－ Power loss (conduction, driving and switching) evaluation

－ Easy to use and fully automated measurement

－ Data sheet characterization mode supports quick and easy evaluations of data sheet parameters

－ Wide operation I/V (1500A, 3kV)Thermal test ( -50°C to +250°C)

－ Oscilloscope View provides visual verification of pulsed measurement waveforms