R&D and validation teams characterizing next-generation digital designs face several test challenges. With data rates continuously increasing, emerging data center standards like OIF CEI and IEEE 802.3 Ethernet are moving to PAM-4 multilevel signaling formats. In addition, many ASIC designs now use built-in self-test (BIST) capabilities such as built-in error counters. Engineers can typically access the error-count information only through vendor-specific interfaces and remote commands.

"The M8000 Series is a highly integrated BER test solution for digital receiver characterization and compliance testing,” said Juergen Beck, general manager and vice president of Keysight's Digital and Photonic Test Division. "With support for PAM-4 and built-in error counters from a common user interface, we are helping engineers overcome their test challenges with next-generation high-speed digital designs.”

The M8000 Series BER test solution accelerates insight into digital designs with fast and accurate receiver characterization for single- and multilane devices. It consists of AXIe-based high-performance BERT and arbitrary waveform generator modules that are controlled from common user interface software.