Keysight EDA’s E4727A is a high-performance noise analyzer designed to make fast, accurate and repeatable low-frequency noise (LFN) measurements. Offering support for wafer mapping measurement and data analysis of 1/f noise and RTN, as well as repeatable and reliable measurement results, the analyzer is well suited for the development, qualification and monitoring of semiconductor materials and IC manufacturing processes.

CEPREI Laboratory, also known as the China Electronic Product Reliability and Environmental Testing Research Institute, is the first scientific research organization to engage in product quality and reliability research in China.

As the affiliated institute directly under the Ministry of Industry and Information Technology (MIIT), CEPREI provides technical support and services not only for industrial management of MIIT and local government, but also for over 10,000 electronic information companies every year.

“The E4727A solution from Keysight was chosen after careful technical evaluation,” said Dr. Liu Yuan, senior engineer at CEPREI. “Its superior performance ensures accurate measurement results with low system noise, while having the industry’s widest frequency and bias measurement range allow us to study various devices and applications. We look forward to further cooperation with Keysight on a calibration method and its standardization.”

“We are pleased that CEPREI has become yet another reference site for our low-frequency noise measurement system,” said Dr. MA Long, device modeling product manager at Keysight EEsof EDA. “Low-frequency noise is a sensitive and important indicator of semiconductor material and manufacturing processes, and is widely used in reliability, new materials and novel device research. Keysight is committed to boosting the relevant activities by strengthening our collaboration with top research institutes such as CEPREI, and other universities throughout the world.”