The device also meets with full industrial specification requirements of -40°C ~ 85°C operating temperature and has high noise immunity. Additionally includes an area of non-volatile EEPROM memory which can be used to save data such as product parameters or manufacturing data. This data will be retained even when power is removed.

The device includes 2K words of Program Memory, 128 bytes of SRAM Data Memory and 32 bytes of Data EEPROM. In addition to the external crystal oscillator, the device also includes an accurate fully internal RC oscillator with selectable frequencies of 4.9152MHz, 9.8304MHz and 14.7456MHz as well as an additional low speed internal RC oscillator with a fixed 32kHz frequency. Additional feature includes an internal LCD driver with a 15×4 pixel output which can directly drive product LCD panels.

The fully integrated and new design 24-bit Delta-Sigma A/D converter has its own LDO output and PGA small signal amplifier. The device includes multiple Timer Modules, which have 5 different operating modes. These are Timer/Counter Mode, Input Capture Mode, Compare Mode, Single Pulse Output Mode and PWM Output Mode.

As for packaging, the device is supplied in a 48-pin LQFP package type. With its abundant hardware resources and flexible functions, the device will be highly capable of providing MCU solutions for a huge variety of high-precision measurement applications such as weight scales, kitchen scales and other high-resolution electronic scales as well as a wide range of other consumer products.

To support the new device, Holtek naturally supplies a full suite of excellent hardware and software development tools including its HT-IDE300 and ICE (In-Circuit-Emulator) which include trace analysis features, breakpoint setup as well as a host of other functions.

The Holtek’s e-WriterPro also provides a means of In-Circuit Programming to allow for fast program updates during development. There are also a range of application guides to ensure developers have their designs up and running in the shortest time possible.